Director

Director

Professor Tsui, Bing-Yue

NCTU EE :

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Plasma process induced damage.,  Electric characterization of low K materials.,  Reliability of Cu-interconnect., Metal gate MOSFET.

Tsui, Bing-Yue

 bytsui@mail.nctu.edu.tw

03-5712121ext.55601 or 54170

03-5724241

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